Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1678887 | Ultramicroscopy | 2007 | 6 Pages |
Abstract
More elaborated specimen preparation techniques for atom probe analysis were developed using a focused ion beam with a sample lift-out system so as to expand the application field in steel materials. The techniques enable atom probe analysis of sample steel at site-specific regions of interest. The preferable form of the needle specimen was provided by electrostatic field calculation using a finite element method. The new techniques were applied to the observation of a bainite–ferrite interface in a low carbon steel, and atomic-scale partitioning and segregation of alloying elements at the phase interface were directly observed in three dimensions.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Jun Takahashi, Kazuto Kawakami, Yukiko Yamaguchi, Masaaki Sugiyama,