Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1678923 | Ultramicroscopy | 2008 | 4 Pages |
Abstract
We have developed a simple and accurate method for calibrating the amplitude of vibration of quartz tuning fork sensors commonly used in atomic force- and near field optical-microscopy. Unlike interferometric methods, which require a complex optical setup, the method we present requires only a simple measurement of the electro-mechanical properties of the tuning-fork oscillator and can be performed in a matter of minutes without disturbing the experimental setup. Comparison with interferometric methods shows that an accuracy of better than few percent can be routinely achieved.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Jinquan Liu, Andrea Callegari, Martin Stark, Majed Chergui,