| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1678945 | Ultramicroscopy | 2007 | 5 Pages |
Abstract
We describe a method of combining STEM imaging functionalities with nanoarea parallel beam electron diffraction on a modern TEM. This facilitates the search for individual particles whose diffraction patterns are needed for diffractive imaging or structural studies of nanoparticles. This also lays out a base for 3D diffraction data collection.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Haifeng He, Chris Nelson,