Article ID Journal Published Year Pages File Type
1678989 Ultramicroscopy 2007 10 Pages PDF
Abstract

We examine the suitability of spherical aberration (CS)-corrected (CS) and uncorrected (UC) transmission electron microscopes (TEM) for conventional bright-field imaging of radiation-sensitive materials. We have chosen an individual molecule suspended in vacuum as a hypothetical example of a well-defined radiation-sensitive sample. We find that for this particular sample, CS instruments provide about 30% improvement over an UC instrument in terms of signal/noise ratio per unit electron dose at 300 kV. The lowest imaging doses can be achieved in CS instruments equipped with high-brightness electron source operated at low incident electron energies. Our calculations suggest that it may be possible to image individual, iodine- or bromine-substituted organic molecules in bright-field mode, at doses lower than the accepted values for radiation damage of aromatic molecules.

Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
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