| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1679006 | Ultramicroscopy | 2008 | 5 Pages |
Abstract
Several technical modifications related to the fabrication and ultra-high vacuum (UHV) treatments of the scanning tunneling microscope (STM) tips have been implemented to improve a reliability of the tip preparation for high-resolution STM. Widely used electrochemical etching drop-off technique has been further refined to enable a reproducible fabrication of the tips with a radius ⩽3 nm. For tip cleaning by a controllable UHV annealing, simple and flexible setup has been developed. Proper W tip preparation has been demonstrated via an imaging of the TiO2 (1 1 0) surface atomic structure.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Z.Q. Yu, C.M. Wang, Y. Du, S. Thevuthasan, I. Lyubinetsky,