Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1679038 | Ultramicroscopy | 2006 | 7 Pages |
Abstract
Using the combination of an electron biprism and an energy filter, the coherence distribution in an inelastically scattered wave-field is measured. It is found that the degree of coherence decreases rapidly with increasing distance between two superimposed points in the object, and with increasing energy-loss. In a Si sample, coherence of plasmon scattering increases in vacuum with the distance from the edge of the sample.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
P.L. Potapov, H. Lichte, J. Verbeeck, D. van Dyck,