Article ID Journal Published Year Pages File Type
1679038 Ultramicroscopy 2006 7 Pages PDF
Abstract

Using the combination of an electron biprism and an energy filter, the coherence distribution in an inelastically scattered wave-field is measured. It is found that the degree of coherence decreases rapidly with increasing distance between two superimposed points in the object, and with increasing energy-loss. In a Si sample, coherence of plasmon scattering increases in vacuum with the distance from the edge of the sample.

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Physical Sciences and Engineering Materials Science Nanotechnology
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