Article ID Journal Published Year Pages File Type
1679047 Ultramicroscopy 2006 9 Pages PDF
Abstract

The measurement of the electronic structure of anisotropic materials using energy loss near edge structure (ELNES) spectroscopy is an important field of microanalysis in transmission electron microscopy. We present a novel method to study the angular dependence of electron inelastic scattering in anisotropic materials. This method has been applied to the study of 1s→π⋆1s→π⋆ and σ⋆σ⋆ transitions on the carbon K edge in pyrolitic graphite. An excellent agreement between experimental and theoretical two-dimensional scattering patterns has been found. In particular, the need of a fully relativistic calculation of the inelastic scattering cross-section to explain the experimental results is demonstrated.

Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
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