Article ID Journal Published Year Pages File Type
1680420 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2013 5 Pages PDF
Abstract
In this work radiation emitted during interaction of medium energy (∼200 keV) heavy ions (Ar, N) with Si (1 1 0) surface and with Fe/Si and Fe/Cu/Si thin (1-50 nm) films in grazing incidence-exit angle geometry were measured in time sequence in order to show that dynamics of selective modification of surface structure and composition can be monitored in-situ with PIXE. It is shown that surfaces of amorphous alloys are not stable against heavy ions (HI) irradiation due to preferential sputtering and implantation and that the dynamics of such modification can also be monitored with PIXE. The method is used for example to find detection limit for implanted Ar ions.
Related Topics
Physical Sciences and Engineering Materials Science Surfaces, Coatings and Films
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