Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1680420 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2013 | 5 Pages |
Abstract
In this work radiation emitted during interaction of medium energy (â¼200Â keV) heavy ions (Ar, N) with Si (1Â 1Â 0) surface and with Fe/Si and Fe/Cu/Si thin (1-50Â nm) films in grazing incidence-exit angle geometry were measured in time sequence in order to show that dynamics of selective modification of surface structure and composition can be monitored in-situ with PIXE. It is shown that surfaces of amorphous alloys are not stable against heavy ions (HI) irradiation due to preferential sputtering and implantation and that the dynamics of such modification can also be monitored with PIXE. The method is used for example to find detection limit for implanted Ar ions.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
MaÅgorzata Antoszewska, Romuald Brzozowski, Józef Balcerski, Kazimierz Dolecki, Ewelina Fra¸tczak, Bogdan PawÅowski, Marek Moneta,