Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1680432 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2015 | 6 Pages |
Abstract
Synchrotron radiation X-ray fluorescence spectroscopy is a method which allows low elemental concentrations to be measured within a sample. To maintain biological or medical relevance increased importance is being placed on quantifying these in situ localized elemental concentrations. For third generation synchrotron light sources, which have the potential for high sample throughput, a rapid method of obtaining a quantification estimate is needed. Non-destructive transmission and surface analysis techniques for first transition metals, or elements of higher atomic number, using reference standards are examined for different sample property regimes to elucidate methods of quantitative synchrotron radiation X-ray fluorescence spectroscopy.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Brian Bewer,