| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1681254 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2011 | 4 Pages |
Secondary electron (SE) emission from thin carbon foils induced by 1–20 keV positrons has been investigated over a range of nominal foil thicknesses from 1.0to5.0μg/cm2. The measurement of SEs was carried out in forward geometry using a microchannel plate as a detector. The SE yield γ has been measured as a function of beam energy and compared with our Monte Carlo simulation results. We also present in this paper the material parameter Λ=γ/(dE/dx)Λ=γ/(dE/dx) and the emitted SE energy spectra. For incident positron energy of 5 keV or higher, the distribution is found to be characterized by the Sickafus form, AE-mAE-m and m is close to 1. For low energy incident positrons, however, another form, Bexp(-E/t)Bexp(-E/t), is proposed for describing the SE distribution.
