Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1681284 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2013 | 4 Pages |
Abstract
X-ray fluorescence computed tomography is a stimulated emission tomography that allows nondestructive reconstruction of elements distribution in the sample and has been applied in many fields. Since 2007 we have developed X-ray fluorescence tomography for microanalysis. In 2010, the system was established at the Shanghai Synchrotron Radiation Facility (SSRF) and preliminary experimental results were obtained at the X-ray imaging (BL13W1) and hard X-ray micro-focusing beamline (BL15U1). Recently, an ordered-subsets expectation maximization algorithm has been introduced to speed up the data acquisition process. We are now studying accelerating X-ray fluorescence computed tomography based fast scanning and the new algorithm.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Biao Deng, Qun Yang, Guohao Du, Yajun Tong, Honglan Xie, Tiqiao Xiao,