Article ID Journal Published Year Pages File Type
1681284 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2013 4 Pages PDF
Abstract

X-ray fluorescence computed tomography is a stimulated emission tomography that allows nondestructive reconstruction of elements distribution in the sample and has been applied in many fields. Since 2007 we have developed X-ray fluorescence tomography for microanalysis. In 2010, the system was established at the Shanghai Synchrotron Radiation Facility (SSRF) and preliminary experimental results were obtained at the X-ray imaging (BL13W1) and hard X-ray micro-focusing beamline (BL15U1). Recently, an ordered-subsets expectation maximization algorithm has been introduced to speed up the data acquisition process. We are now studying accelerating X-ray fluorescence computed tomography based fast scanning and the new algorithm.

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Physical Sciences and Engineering Materials Science Surfaces, Coatings and Films
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