| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1681378 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2010 | 5 Pages |
Recently, it has been demonstrated that each single-impact of a slow (typically 1–2 keV/u) highly charged ion (HCI) creates truly topographic and non-erasable nanostructures on CaF2 surfaces. To further explore the possibility of nanostructuring various surfaces, using mainly the potential energy stored in such HCIs, projectiles with kinetic energies as low as possible are required. For this purpose a new apparatus, capable of focusing and decelerating an incoming ion beam onto a solid or gaseous target, has been installed at the Heidelberg electron beam ion trap (EBIT). An X-ray detector and a position-sensitive particle detector are utilized to analyze the beam and collision products. First experiments have already succeeded in lowering the kinetic energy of HCIs from 10 keV/q, down to ∼30 eV/q, and in focusing the decelerated beam to spot sizes of less than 1 mm2, while maintaining the kinetic energy spread below ∼20 eV/q.
