Article ID Journal Published Year Pages File Type
1681758 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2016 10 Pages PDF
Abstract

It is proposed to produce highly charged ions in the local potential traps formed by the rippled electron beam in a focusing magnetic field. In this method, extremely high electron current densities can be attained on short length of the ion trap. The design of very compact ion sources of the new generation is presented. The computer simulations predict that for such ions as, for example, Ne8+ and Xe44+, the intensities of about 109109 and 106106 ions per second, respectively, can be obtained. The experiments with pilot example of the ion source confirm efficiency of the suggested method. The X-ray emission from Ir59+, Xe44+ and Ar16+ ions was detected. The control over depth of the local ion trap is shown to be feasible.

Related Topics
Physical Sciences and Engineering Materials Science Surfaces, Coatings and Films
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