| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1681809 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2013 | 4 Pages |
Abstract
We present the charge state distributions of highly charged ions extracted from an electron beam ion trap (EBIT). The distributions were obtained in the two different extraction modes, pulsed mode and leaky mode. The number ratio between adjacent charge state ions, which is an important quantity to measure dielectronic recombination cross sections with an EBIT, is compared between the two extraction modes. The results are also compared with recent theoretical predictions by Zhang et al. [17].
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Authors
Zhimin Hu, Yusuke Ishiguro, Hirofumi Watanabe, Shunsuke Ohtani, Nobuyuki Nakamura,