Article ID Journal Published Year Pages File Type
1682582 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2009 4 Pages PDF
Abstract

The track damage created in LiF crystals by swift U, Xe and Kr ions with a specific energy of 11.1 MeV/u was studied using dislocation mobility measurements, track etching, SEM, AFM and optical microscopy. The results demonstrate high sensitivity of dislocation mobility to track core damage. The relationship between the energy loss of ions, dislocation mobility and track structure is discussed.

Related Topics
Physical Sciences and Engineering Materials Science Surfaces, Coatings and Films
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