Article ID Journal Published Year Pages File Type
1682729 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2009 4 Pages PDF
Abstract
Ejected electron angular distributions are measured for single and double ionization of argon by 500 eV positron and electron impact. Double to single ionization ratios show marked differences as a function of projectile charge. Combinations of the positron and electron data and a simple double ionization model are used to obtain differential information about the TS-1 and TS-2 mechanisms. Our analysis suggests that both mechanisms contribute roughly equally to the emission of two electrons and that interference between the two mechanisms significantly alters the ejected electron spectra.
Related Topics
Physical Sciences and Engineering Materials Science Surfaces, Coatings and Films
Authors
, , ,