| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1683049 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2011 | 6 Pages |
Abstract
Computer simulation using GEANT4 codes indicates an enhancement of the fraction of implanted positrons stopped in the denser regions of a layered sample. However, positron lifetime measurements performed for layers of pure aluminum, silver and gold foils do not reveal this effect, indicating instead that backscattering plays an important role in determining the positron implantation profile in layered and/or heterogeneous samples.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Jerzy Dryzek, PaweÅ Horodek,