| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1683077 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2008 | 10 Pages |
Abstract
As a preparatory work for constructing the FAIR facility at GSI, samples of stainless steel and copper were irradiated by 950 MeV/u 238U ions and depth-profiles of residual activity were measured by gamma-ray spectroscopy. The isotopes with dominating contribution to the residual activity were identified and their contributions were quantified. In contrast to the previous study performed at lower energies, the activities could no longer be determined from the full-assembly target measurements. Depth-profiling of residual activity of all identified isotopes had to be completed by measurements of individual target foils. The activity contributions were then obtained by integration of the depth-profiles.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
I. Strašík, E. Mustafin, A. Fertman, R. Hinca, M. Pavlovič, D. Schardt, N. Sobolevskiy, A. Golubev, B. Sharkov, G. Fehrenbacher, I. Hofmann, H. Iwase, E. Kozlova, G. Mustafina,