Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1683348 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2011 | 5 Pages |
Abstract
The development of an intense X-ray source using backscattered X-ray produced using an advanced electrode configuration is described. The electrodes were composed of field emitters deposited on a wire mounted on a perforated plate as the cathode and a copper plate as the anode. Electrons from these emitters collided with the copper plate and X-ray was generated at collision points. The backscattered X-ray in the direction normal to the electron trajectory through a hole in the anode escaped from the vacuum chamber through a beryllium window. Continuous and characteristic X-rays were detected at an applied voltage lower than that of a conventional X-ray source from 3.0 to 9.4Â kV, respectively. Moreover, the X-ray dosage measured with a survey meter reached 0.95Â mSv/h at 5.0Â kV of applied voltage. The transmission images of three types of material used as an X-ray source for the X-ray imaging system indicate three advantages; low power consumption, focal point controllable by adjusting applied voltage, and photographable motion picture of X-ray transmission.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Keisuke Tanizawa, Tetsuo Sekiya, Shigeo Ohshio, Hiroki Akasaka, Hidetoshi Saitoh,