| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1683487 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2010 | 5 Pages |
Abstract
The ferroelectric Pb(Zr0.48Ti0.52)O3 (PZT) thin films prepared by the pulsed laser deposition technique were studied for their response to high energy lithium ion irradiation through impedance spectroscopy. The Debye peaks, observed in the impedance and modulus plots of irradiated films, shifts towards higher frequencies compared to those of unirradiated films. This is equivalent to the trend observed with increase in temperature in the unirradiated films due to the dielectric relaxation. The irradiated films showed a decrease in the grain resistance compared to the unirradiated films. The activation energy of dielectric relaxation increases from 1.25Â eV of unirradiated film to 1.62Â eV of irradiated film. The observed modifications in the irradiated film were ascribed to the modifications in the grain structure due to the high value of electronic energy loss.
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Authors
Basavaraj Angadi Basavaraj Angadi, V.M. Jali, Ravi Kumar Ravi Kumar, S.B. Krupanidhi,