| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1683719 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2007 | 5 Pages |
Abstract
In this paper, an application of the CMOS sensor to X-ray tomography is described. Preliminary results are reported and discussed.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
A. Brunetti, R. Cesareo,