| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1683784 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2013 | 4 Pages |
Abstract
The present simulation demonstrates the energy loss of each individual secondary electron due to the composite electric field formed from molecular ions. Both of the secondary electron and molecular ions are produced from an incident ion impact ionization process. The initial conditions of the secondary electron under which this electron is trapped near the trajectory are found for a proton and a carbon ion.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Kengo Moribayashi,