Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1683820 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2013 | 4 Pages |
Abstract
We studied the change in crystal structure of 200 MeV Xe and 10 MeV I ion irradiated CeO2 thin films by means of X-ray diffraction (XRD). The experimental result showed that the average lattice parameter of CeO2 decreased and the full width at half maximum increased by the ion irradiation. Their changes are well correlated with the electronic stopping powers for I and Xe ions. The dependence of lattice parameter on the electronic energy loss was analyzed by using the Poisson’s law, and the radii of the regions affected by the irradiation were determined.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
T. Kishino, K. Shimizu, Y. Saitoh, N. Ishikawa, F. Hori, A. Iwase,