| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1683931 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2009 | 4 Pages |
Abstract
The chemical bonds between carbon and nitrogen were studied as a function of depth by X-ray photoelectron spectroscopy (XPS). The C 1s and N 1s core level photoelectron spectra revealed the presence of different types of C-N bonds, which correspond to specific kinds of chemical states. These results indicate that different carbon nitride compounds have been formed during the implantation.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
J.L. Colaux, P. Louette, G. Terwagne,