| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1683964 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2009 | 4 Pages |
Abstract
In this study, morphologies of as-deposited and rapid thermal annealed films of silver nanoclusters are studied using scanning electron microscope (SEM) and atomic force microscope (AFM). Size-selected silver nanoclusters, containing 5000 atoms in a cluster, produced by the gas condensation method are deposited on Si substrate for a period of 8 min. In order to get an idea about the melting of clusters, the film is treated by rapid thermal annealing at 200 and 400 °C. The remarkable changes of morphology due to annealing signify a lowering of melting temperature of silver in the form of nanoscale particles.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
S.R. Bhattacharyya, D. Datta, T.K. Chini, D. Ghose, I. Shyjumon, R. Hippler,