| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1684059 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2013 | 4 Pages |
Abstract
Capillary optics is a fundamental X-ray technology capable of generating a high flux density with sub μm spot size. The physical basis of capillary optics refers to the mechanism of the total external reflection of X-rays although experimental data about the transport of the radiation inside such kind of structures are really limited.We present here the data of reflection and transmission soft X-ray synchrotron radiation experiments performed with different types of microchannel plates. In particular, we discuss the presence of fine structures in the XANES spectra at the energy of the Si L-edges detected at the exit of micro-capillary structures under the condition of the total X-ray reflection.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
M.I. Mazuritskiy, S.B. Dabagov, K. Dziedzic-Kocurek, A. Marcelli,