Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1684234 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2010 | 5 Pages |
Abstract
Helium ions of 500 keV were implanted with a fluence of 1.4 Ã 1017 ion/cm2 into various lithium silicates to investigate whether a threshold level of helium retention exists in Li-containing silicate ceramics similar to that found in SiOx in previous work. The composition and phases of the as prepared lithium silicates were determined by proton backscattering spectrometry (p-BS) and X-ray diffraction (XRD) methods with an average error of ±10%. Electrostatic charging of the samples was successfully eliminated by wrapping the samples in Al foil. The amounts of the retained helium within the samples were determined by subtracting the non-implanted spectra from the implanted ones. The experimental results show a threshold in helium retention depending on the Li concentration. Under 20 at.% all He is able to escape from the material; at around 30 at.% nearly half of the He, while over 65 at.% all implanted He is retained. With compositions expressed in SiO2 volume percentages, a trend similar to those reported of SiOx previously is found.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
D.E. SzÅcs, E. Szilágyi, Cs. Bogdán, E. Kótai, Z.E. Horváth,