| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1684306 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2006 | 4 Pages |
Abstract
Nanosized ripples are formed on Al thin films by oblique angle low energy O2+ ion beam sputtering. Conductive atomic force microscopy (C-AFM) shows that the ripples are composed of periodically spaced thin insulating layers on the metal substrate.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
P. Mishra, P. Karmakar, D. Ghose,