| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1684506 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2013 | 4 Pages |
Abstract
⺠A new comprehensive method to analyze directly thick insulating samples by PIXE technique is presented. ⺠The method is based on the use of an electron flood gun and a beam profile monitor. ⺠Both accuracy and precision of the experimental procedure were successfully verified using reference material.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
I.M. Ismail, M.S. Rihawy,