| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1684529 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2008 | 5 Pages |
Abstract
A method for modeling charge cluster formation by a single ionizing particle in nanoelectronic structures of few nanometres size is presented. The method is based on experimental modeling of charge formation in the equivalent gaseous nanosites irradiated by single charged particles and the subsequent scaling procedure to a needed medium. Propane irradiated by alpha particles is presented as an example.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
S. Pszona, A. Bantsar, J. Kula,