| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1684650 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2007 | 4 Pages |
Abstract
The secondary electron yield from carbon induced by the ions C+, O+, CO+ and O2+ has been measured as a function of ion energy in the range of 2 to 20 keV. It has been observed that electron yield from carbon increases with projectile energy. By comparing electron yields induced by equally fast atomic and molecular projectiles, a molecular effect as a yield reduction has been observed. The measured molecular effect was stronger than the predictions of sweeping-out-electron model.
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Authors
A.H. Dogar, Shakir Ullah, A. Qayyum,