Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1684925 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2007 | 5 Pages |
Abstract
The backward and forward electron emission yields γB and γF have been calculated by Monte Carlo simulations for helium (He++, He+ or He0) ions incident on thin amorphous carbon foils with energies around the electronic stopping power maximum (0.2-2 MeV). Besides the direct excitation of target electrons by the incident projectile, we have taken into account the different charge changing processes (He++ â He+ â He0) undergone by the helium ion in the target. We discuss in particular the connection between the electron emission yield γ and the electronic stopping power (dE/dx)e. We compare our results with previously published experimental results.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
N. Pauly, A. Dubus, M. Rösler,