Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1685365 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2009 | 4 Pages |
Abstract
A metal-oxide-silicon (MOS) tunneling light-emitting diode is fabricated with ion-beam-synthesized β-FeSi2 precipitates embedded in the active region. Fe ions were implanted into pâ-100 silicon substrate at cryogenic temperature (â¼â120 °C), followed by rapid thermal oxidation (RTO). Under constant voltage biased in accumulation and at temperatures down to 80 K, electroluminescence (EL) with wavelength peaking at â¼1.5 μm is observed at a current density of about 2.0 A/cm2. Light output increases linearly with current density. Temperature dependence of the EL shows that the luminescence is due to interband recombination in the crystalline precipitates. The strain in these isolated precipitates may contribute to the luminescence properties of β-FeSi2 in silicon.
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Authors
C.M. Sun, H.K. Tsang, S.P. Wong, W.Y. Cheung, N. Ke, M.A. Lourenço, K.P. Homewood,