| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1685498 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 8 Pages |
Abstract
For the analysis of thick metal targets with PIXE, an algorithm for the evaluation of elemental concentrations from the measured X-ray intensities was developed. Fast procedures for calculation of thick target integrals were introduced. Application of the algorithm was demonstrated on Roman military equipment, where different alloys of non-ferrous metals were identified.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Ž. Šmit, P. Pelicon, J. Simčič, J. Istenič,