Reconstruction of depth distribution of tritium in materials by β-ray induced X-ray spectrometry

Monte Carlo calculations, instead of the analytical method, are incorporated into the β-ray induced X-ray spectrometry for analyzing the tritium content and depth distribution in the near surface. This improvement makes the β-ray induced X-ray spectrometry for tritium analysis be able to take into account the physics processes more accurately and be utilized more flexibly. The inverse problem involved is treated by using the Tikhonov regularization method and classical molecular dynamics method. The results concerned are discussed.