| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1686069 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2008 | 6 Pages |
Abstract
Irradiation effects on pre-amorphized Sr2Nd8(SiO4)6O2 have been investigated under 200 and 300Â keV electron-beam (e-beam) irradiation at 130 and 480Â K using in situ transmission electron microscopy. At 480Â K, recrystallization occurred from the amorphous/crystalline interface under both 200 and 300Â keV e-beam irradiation. At 130Â K, the 200Â keV e-beam irradiation induced recrystallization only; however, 300Â keV e-beam irradiation induced both recrystallization and an electron hammering effect in the amorphous material that resulted in radial expansion perpendicular to the incident e-beam direction and shrinkage parallel to the e-beam direction. Ionization-induced processes and knock-on displacement damage are suggested to be the mechanisms for the recrystallization and the electron hammering effect, respectively.
Keywords
Related Topics
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Materials Science
Surfaces, Coatings and Films
Authors
I.-T. Bae, Y. Zhang, W.J. Weber, M. Ishimaru, Y. Hirotsu, M. Higuchi,