| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1686086 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2011 | 4 Pages |
Abstract
Simple and efficient method for precise surface density measurement in the range of about few mg/cm2 for layers consisting of heavy elements, based on photon induced X-ray emission has been developed. The method has been applied to analyze Mott-scattering targets used in the measurement of the transverse electron polarization of electrons emitted in the neutron beta decay. The achieved relative accuracy is 1%. The absolute calibration accuracy of 2.3% was achieved with the atomic absorption spectroscopy.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
A. Kozela, A. BiaÅek, K. Bodek, P. Gorel, St. Kistryn, E. Stephan, J. Zejma,