Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1686217 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2011 | 4 Pages |
Abstract
Here we report highly charged 40Neq+ (q = 3–8) and 129Xeq+ (q = 10–30) ion-induced secondary electron emission on the tungsten and highly oriented pyrolytic graphite (HOPG) surfaces. The total secondary electron yield is measured as a function of the potential energy of incident ion. The experimental data is used to separate contributions of kinetic and potential electron yields. We estimate roughly 10% of ion’s potential energy is consumed in potential electron emission. The rest of the ion’s potential energy is responsible for the sputtering and material modification.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Yuyu Wang, Yongtao Zhao, Jianrong Sun, A. Qayyum, Jie Liu, Zhiguang Wang, Guoqing Xiao,