Article ID Journal Published Year Pages File Type
1686217 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2011 4 Pages PDF
Abstract

Here we report highly charged 40Neq+ (q = 3–8) and 129Xeq+ (q = 10–30) ion-induced secondary electron emission on the tungsten and highly oriented pyrolytic graphite (HOPG) surfaces. The total secondary electron yield is measured as a function of the potential energy of incident ion. The experimental data is used to separate contributions of kinetic and potential electron yields. We estimate roughly 10% of ion’s potential energy is consumed in potential electron emission. The rest of the ion’s potential energy is responsible for the sputtering and material modification.

Related Topics
Physical Sciences and Engineering Materials Science Surfaces, Coatings and Films
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