Article ID Journal Published Year Pages File Type
1686305 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2006 4 Pages PDF
Abstract

MgB2 thin films with Tc = 19 K were fabricated by the ion ablation technique utilizing a high-energy pulsed ion beam. A target remains pure MgB2 after ablation, proving the excellent capability of ablation by the high-power ion beam. Chemical compositions of the deposited material, however, may vary with positions of the substrates from the beam axis. X-ray diffraction patterns exhibit only (0 0 1) and (0 0 2) peaks, which indicate a c-axis orientation of the films. Scanning electron microscopy images show a possible growth of single crystals with hexagonal shape and 1 μm size.

Related Topics
Physical Sciences and Engineering Materials Science Surfaces, Coatings and Films
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