Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1686396 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2008 | 7 Pages |
Abstract
The Lk (k = l, α, β1,4, β3,6, β2,15,9,10,7, γ1,5 and γ2,3,4) X-ray production (XRP) cross sections have been measured for six elements with 56 ⩽ Z ⩽ 68 at 22.6 keV incident photon energy using the EDXRF spectrometer. The incident photon intensity, detector efficiency and geometrical factors have been determined from the K X-ray yields emitted from elemental targets with 22 ⩽ Z ⩽ 42 in the same geometrical setup and from knowledge of the K XRP cross sections. The L1 and L2 subshell fluorescence yields have been deduced from the present measured Lk XRP cross sections using the relativistic Hartree-Fock-Slater (HFS) model based photoionization cross sections. The present deduced Ï1 (exp) values have been found to be, on an average, higher by 15% and 20% than those based on the Dirac-Hartree-Slater (DHS) model and the semi-empirical values compiled by Krause, respectively, for elements with 60 ⩽ Z ⩽ 68.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Yogeshwar Chauhan, M.K. Tiwari, Sanjiv Puri,