| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1686485 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2006 | 4 Pages |
Abstract
To illustrate the analytical capability of this technique, a 2Â MeV proton beam was focussed at different incident angles onto a 4H-SiC Schottky diode; the experimental results and the theoretical approach are presented and discussed.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
A. Lo Giudice, Y. Garino, C. Manfredotti, V. Rigato, E. Vittone,