Ion beam analysis of Cs-implanted zirconia and spinel

Fission products (Cs) were introduced into yttria-stabilized zirconia (YSZ) and magnesium aluminate spinel (MAS) single crystals by room temperature ion implantation. The effect of high-temperature annealing on the depth distribution of implanted species and the surface homogeneity of crystals were investigated by the combination of AFM and RBS using a macro- and a micro-ion beam. The diffusion and release of Cs involve mechanisms which depend on the material and Cs concentration. In YSZ Cs desorbs out of the crystal at lower temperature (∼550 °C) than in MAS (∼850 °C). In YSZ the surface of the sample remains unaltered when Cs desorption occurs, whereas in MAS Cs desorption is accompanied by the exfoliation of the sample surface.