| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1686617 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2006 | 11 Pages |
Abstract
A new program, named Beatrice, has been developed for the quantitative estimation of layer thicknesses of single- and multilayers on the basis of their CEMS (conversion electron Mössbauer spectroscopy) spectra. The Beatrice program is able to estimate the individual layer thicknesses of multilayers consisting of several homogeneous or mixed nanolayers. The program can also be applied for samples with composition varying continuously with depth, as well as for samples displaying columns of different layer structures. The capability of the program is demonstrated by deriving functional dependences between relative CEMS subspectrum areas and sublayer thicknesses in simple but practically important cases.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Ferenc Nagy, Zoltán Klencsár,