Article ID Journal Published Year Pages File Type
1686760 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2010 6 Pages PDF
Abstract

In this work, we report on calculations of the electronic channelling energy loss of hydrogen and helium ions along Si〈1 0 0〉 and Si〈1 1 0〉 axial directions for the low energy range by using the Monte Carlo simulation code. Simulated and experimental data are compared for protons and He ions in the 〈1 0 0〉 and 〈1 1 0〉 axis of silicon. A reasonable agreement was found.Computer simulation was also employed to study the angular dependence of energy loss for 0.5, 0.8, 1, and 2 MeV channelled 4He ions transmitted through a silicon crystal of 3 μm thickness along the 〈1 0 0〉 axis.

Related Topics
Physical Sciences and Engineering Materials Science Surfaces, Coatings and Films
Authors
, ,