| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1686855 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2006 | 4 Pages |
Abstract
A new result on the deflection of 150 MeV electron beams with using the 〈1 0 0〉 axis of a silicon crystal is presented. The channeling effect of electrons passed through the crystal was clearly seen. We also studied dependence of the deflection on the beam divergence. The simulation qualitatively agreed with the experimental data.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
S. Strokov, T. Takahashi, I. Endo, M. Iinuma, K. Ueda, H. Kuroiwa, T. Ohnishi, S. Sawada,