| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1687206 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2006 | 4 Pages |
Abstract
This paper presents the vulnerabilities of single event effects (SEEs) simulated by heavy ions on ground and observed on SJ-5 research satellite in space for static random access memories (SRAMs). A single event upset (SEU) prediction code has been used to estimate the proton-induced upset rates based on the ground test curve of SEU cross-section versus heavy ion linear energy transfer (LET). The result agrees with that of the flight data.
Keywords
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Materials Science
Surfaces, Coatings and Films
Authors
J. Liu, J.L. Duan, M.D. Hou, Y.M. Sun, H.J. Yao, D. Mo, Q.X. Zhang, Z.G. Wang, Y.F. Jin, J.R. Cai, Z.H. Ye, J.W. Han, Y.L. Lin, Z. Huang,