Article ID Journal Published Year Pages File Type
1687259 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2009 6 Pages PDF
Abstract

The Ion Beam Induced Charge (IBIC) technique was used to map the charge collection efficiency (CCE) of a 4H–SiC photodetector with coplanar interdigitated Schottky barrier electrodes and a common ohmic contact on the back side.IBIC maps were obtained using focused proton beams with energies of 0.9 and 1.5 MeV, at different bias voltages and different sensitive electrode configurations (charge collection at the top Schottky or at the back Ohmic contact).These different experimental conditions have been modeled using a two-dimensional finite element code to solve the adjoint carrier continuity equations and the results obtained have been compared with experimental results. The excellent agreement between the simulated and experimental CCE maps allows an exhaustive interpretation of the charge collection mechanisms occurring in pixellated or strip detectors.

Related Topics
Physical Sciences and Engineering Materials Science Surfaces, Coatings and Films
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