Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1687336 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2006 | 4 Pages |
Abstract
AFM studies of swift (â¼100Â MeV) heavy ions (of Si7+ and Au7+) irradiated n-GaAs have been performed for a variable fluence of 1010-1013Â cmâ2. The craters with a piled up material are clearly seen in the AFM micrographs. It is observed that the gold ions are inducing more damage than silicon ions as the estimated volume of craters and surface roughness are larger for gold ion irradiation than the silicon ion irradiation. The feature of overlapping craters has also been observed for n-GaAs surfaces. The observed features are related to the large electronic loss of the incident ions, thermal diffusivity and thermal conductivity of the target material.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
O.P. Sinha, V. Ganesan, P.C. Srivastava,