| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1687591 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2008 | 5 Pages |
Recent progress in thin film techniques has made possible the fabrication of stable and pollution-free reference standards. Thin Si3N4 film (thickness 70 nm) and thin Al foil (150 nm) were selected to measure the differential cross-sections of nuclear reactions induced by deuterons, from 1 to 2 MeV. The absence of oxygen and carbon in the standard, as well as the stoichiometry, were checked prior to measurement by RBS. The differential cross-sections of the 27Al(d,p0p1)28Al, 27Al(d,p2p3)28Al, 27Al(d,p5p6)28Al, 27Al(d,p9)28Al, 27Al(d,p10)28Al, 27Al(d,p11)28Al, 27Al(d,p12)28Al, 27Al(d,α0)25Mg and 27Al(d,α2)25Mg reactions for aluminium and 28Si(d,p0)29Si– 29Si(d,p1)30Si, 28Si(d,p1)29Si– 29Si(d,p2)30Si, 28Si(d,p2)29Si, 28Si(d,p3)29Si, 28Si(d,p9p10)29Si reactions for silicon were determined for a detector angle of 150°.
