Article ID Journal Published Year Pages File Type
1687649 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2008 6 Pages PDF
Abstract

E-beam evaporated aluminum oxide films were irradiated with 120 MeV swift Au9+ ions in order to induced nanostructure formation. Atomic force microscope (AFM) results showed the formation of nanostructures for films irradiated with a fluence of 1 × 1013 ions cm−2. The particle size estimated by section analysis of the irradiated film was in the range 25–30 nm. Glancing angle X-ray diffraction (GAXRD) revealed the amorphous nature of the films. Two strong Photoluminescence (PL) emission bands with peaks at ∼430 nm and ∼645 nm besides a shoulder at ∼540 nm were observed in all irradiated samples. The PL intensity is found to increase with increase of ion fluence.

Related Topics
Physical Sciences and Engineering Materials Science Surfaces, Coatings and Films
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